Ion microscopy with resonant ionization mass spectrometry: time-of-flight depth profiling with improved isotopic precision

Title: Ion microscopy with resonant ionization mass spectrometry: time-of-flight depth profiling with improved isotopic precision
Creator: Pellin, Michael J.; Veryovkin, Igor V.; Levine, Jonathan; Zinovev, Alexander; Davis, Andrew M.; Stephan, Thomas; Tripa, C. Emil; King, Bruce V.; Savina, Michael R.
Relation: European Journal of Mass Spectrometry Vol. 16, Issue 3, p. 373-377
Publisher Link: http://dx.doi.org/10.1255/ejms.1085
Publisher: IM Publications
Resource Type: journal article
Date: 2010
Description: There are four generally mutually exclusive requirements that plague many mass spectrometric measurements of trace constituents: (1) the small size (limited by the depth probed) of many interesting materials requires high useful yields to simply detect some trace elements, (2) the low concentrations of interesting elements require efficient discrimination from isobaric interferences, (3) it is often necessary to measure the depth distribution of elements with high surface and low bulk contributions, and (4) many applications require precise isotopic analysis. Resonant ionization mass spectrometry has made dramatic progress in addressing these difficulties over the past five years.
Subject: resonant ionization mass spectrometry; isotopic analysis; depth profiling; useful yield; RIMS; cosmochemistry
Identifier: http://hdl.handle.net/1959.13/931806
Identifier: uon:11171
Identifier: ISSN:1469-0667
Language: eng
Reviewed

		Thumbnail	File	Description	Size	Format